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This diffractometer collects with high angular resolution
(down to 0.008 degrees in two-theta) powder X-ray diffraction
patterns of polycrystalline samples. With the multi-channels
detector (VANTEC), fast acquisition of scans are possible,
in less than 2 minutes under favorable conditions.
This diffractometer can also be used for routine measurement
when sample are available in large quantity. An automatic
sample loader is available for this purpose.
In addition, the D8/Advance diffractometer can be equipped
with a chamber for variable temperature or low pressure
experiments.
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